Logical and physical optimization of DFT improves PPA.

AI-driven automation, tighter design-test collaboration, and evolving BiST techniques are redefining DFT strategies.

Miteshwar M. Patel (ASIC Engineer, eInfochips Ltd) Nirav Nanavati (Tech Lead, eInfochips Ltd) Abstract Design for testability (DFT) and low power issues are very much related with each other. In this ...

This paper delves into the niche area of functional tester pattern debug on Silicon , which are required to augment the DFT scan tests as scan coverage holes often exist in the digital interface of ...

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