This paper describes the detailed aspects of hierarchical DFT, with Shared Scan-in methodology using DFTMAX, the low pin count solution from Synopsys. The technique of sharing scan-in data between ...
Next Gen Scan Compression Technique to overcome Test challenges at Lower Technology Nodes (Part - I)
Smart devices for industrial and home applications Aerospace ... As technology is continuously shrinking from 60 nm to 16nm, 7nm & now we are into the DFT implementation at 5 & 3nm lower technology ...
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