With advanced technology nodes, the SoCs are growing in density and gate count. This creates challenges regarding the testability, and more importantly, the test cost. The design complexity and size ...
Next Gen Scan Compression Technique to overcome Test challenges at Lower Technology Nodes (Part - I)
We live in an era where the demand for portable and wearable devices have been increasing multifold. Products based on applications like IoT (Internet of Things), Artificial Intelligence, Virtual ...
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