Majorly, in DFT, we avoid mixing different clocks in the same chain, but if there is a constraint to I/O ports we have to stitch scan flops driven by two different clocks in one chain. However, such a ...

In this mode, the test pattern response captured at the SI pins of the flip-flops is shifted serially out to the scan output port to crosscheck it with the expected results. As we have discussed ...

Part I of this article discusses the design-for-test (DFT) challenges of AI designs and strategies to ... the pins are easily accessible for delivering scan and test configuration data (test-setup, ...