Rooting out the causes of silent data corruption errors will require testing improvements and much more. Silent data errors ...

SiConic Link flexibly connects to standard evaluation boards through functional interfaces like USB, PCIe, control interfaces ...

Doctors have known that radiation exposure from computed tomography—also called a CT scan—comes with cancer risk. But the risk seems to be higher than previously expected, according to a new study ...

To exploit the potential of Mamba in HSI classification deeply, this article presents a new spatial-spectral complementary Mamba with a spatial spiral scan named SpiralMamba. It mainly encloses three ...

From reproductive rights to climate change to Big Tech, The Independent is on the ground when the story is developing. Whether it's investigating the financials of Elon Musk's pro-Trump PAC or ...

In some cases, the information provided by a CT scan could also be obtained from other tests that emit less or no radiation — but CTs can be lifesaving for emergency care. If your doctor ...

ABSTRACT: The FPGA and ASIC debugging, boundary scan testing, and device coding owe vivid gratitude to JTAG Interfaces (Joint Test Action Group format adhering largely to IEEE 1149.1 standards). In ...

This staggering number represents nearly one-fifth of the entire U.S. population receiving at least one scan within a single year. Many patients undergo multiple scans, particularly those with ...

“Next Wednesday, I go in and get my next CAT scan, where they’ll find out if these recent tumors are getting smaller,” she confirmed. “And then I also get my third round of immunotherap ...

The humble QR (or Quick Response) code has become ubiquitous. Invented back in the 1990s to scan car parts, the barcodes got a popularity boost during the pandemic when touchless tech became ...

“Reducing the number of scans and reducing doses per scan would save lives.” The authors warned that some CT scans are overused, including those for upper respiratory infections or for headach ...

This paper delves into the niche area of functional tester pattern debug on Silicon , which are required to augment the DFT scan tests as scan coverage holes often exist in the digital interface of ...