This paper describes the detailed aspects of hierarchical DFT, with Shared Scan-in methodology using DFTMAX, the low pin count solution from Synopsys. The technique of sharing scan-in data between ...

In hierarchical DFT efforts, all implementation, including pattern generation and verification, is done at the core level, which presents some challenges. To test a group of cores concurrently using a ...

Smart devices for industrial and home applications Aerospace ... As technology is continuously shrinking from 60 nm to 16nm, 7nm & now we are into the DFT implementation at 5 & 3nm lower technology ...

Optimize AI accelerators with efficient design and test methodologies. Explore strategies for streamlining DFT and silicon ...