Learn how Picotest is trying to tackle the challenges with more advanced test probes ... quantifying the probe GND pin tip resistance. To do so, one must measure the SHORT, but not with Kelvin ...

The spring-loaded contacts, which short together when not in use ... free testing without the risk of an errant touch of the test probes sending it flying. While the test fixture works well ...

A full line of high-speed test probes have been designed to perform high cycle, high reliability IC testing and have operating lengths as short as 2.5 mm (.098") to assure less than 1 nH self ...

MEMS (Micro-Electro-Mechanical Systems, MEMS) probe card with the optimized structure and is an ideal to support fine-pitch and high-pin count test requirements. The Virgo Prima MEMS micro ...