Among the various types of electron microscopy, scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are the most common. While both techniques harness the power of electrons ...

The sample chamber is placed under high-vacuum. Electron apertures. TEM enables data to be captured regarding the sample’s inner structure, where SEM provides data about the surface of the analyzed ...

SEM and TEM cross-section samples can be produced using the PELCO ® Tripod Polisher™ 590. To create a TEM sample the original sample is attached to the face of a unique SEM stud, which is then ...

Overlaying the Raman image on the SEM micrograph allowed the precise location of each polymorph to be identified (figure 2) and tracked for TEM preparation. FIB was then used to prepare a thin ...

Figure 2: SEM and TEM images of graphene–polystyrene composite. The conductive nature of the graphene filler motivated our study of the percolation behaviour through electrical measurements.