Description: Electron diffraction patterns for single crystal and polycrystalline materials are displayed on a CRT screen. A Welch model 2639 'Electron Diffraction tube' is used in an experiment in ...

is an advanced method for determining crystallographic orientation from electron backscatter diffraction (EBSD) patterns. Noise can degrade EBSD indexing performance by obstructing the detection of ...

EDAX neighbor pattern averaging and reindexing (NPAR ™) is a technique used to determine the crystallographic orientation within electron backscatter diffraction (EBSD) patterns. The performance of ...

Compared to conventional kinematic diffraction-based methods, this optional module for EDAX OIM Analysis ™ generates more realistic pattern simulations and more correctly captures electron interaction ...