Majorly, in DFT, we avoid mixing different clocks in the same chain, but if there is a constraint to I/O ports we have to stitch scan flops driven by two different clocks in one chain. However, such a ...

In this mode, the test pattern response captured at the SI pins of the flip-flops is shifted serially out to the scan output port to crosscheck it with the expected results. As we have discussed ...

In hierarchical DFT efforts, all implementation, including pattern generation and verification, is done at the core level, which presents some challenges. To test a group of cores concurrently using a ...

Optimize AI accelerators with efficient design and test methodologies. Explore strategies for streamlining DFT and silicon ...