Abstract As gate counts continue to swell at a rapid pace, modern systems-on-chip (SoCs) are increasingly integrating more design-for-testability (DfT) capabilities 1. Test and diagnosis of complex ...
When the design size begins to reach the capacity of ATPG (Automatic Test Pattern Generation), a hierarchical approach for structured DFT implementation and pattern generation provides several ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback